EMSE515 (3): Analytical Methods of Materials Science
Description:
Microcharacterization techniques of materials science and engineering: SPM (scanning probe microscopy), SEM (scanning electron microscopy), FIB (focused ion beam) techniques, SIMS (secondary ion mass spectrometry), EPMA (electron probe microanalysis), XPS (X-ray photoelectron spectrometry), and AES (Auger electron spectrometry), ESCA (electron spectrometry for chemical analysis). The course includes theory, application examples, and laboratory demonstrations.
Course Offering Plan: Bi-annually (lastest in Fall 2007) Course Evaluations (Case network ID and password required) Syllabus (in pdf) |
