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This course introduces
students to a variety of microcharacterization
techniques that are of great importance in
materials science and engineering: SPM (scanning
probe microscopy, including atomic force microscopy
and scanning tunneling microscopy), SEM (scanning
electron microscopy), FIB (focused ion beam)
techniques, SIMS (secondary ion mass spectrometry),
EPMA (electron probe microanalysis), XPS (X-ray
photoelectron spectrometry), and AES (Auger
electron spectrometry).
For each technique, lectures explaining the
principle and theoretical background will be
followed by practical examples from recent
materials research and laboratory demonstrations in
the
Swagelok Center for Surface Analysis of Materials.
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NEWS
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