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The Scintag X-1 advanced X-ray
diffractometer is available for X-ray
diffraction experiments. Normal theta-theta
scans are routine, but it is also possible
to record rocking curves and sample-tilting
curves. For examining films that are too
thin to produce sufficient signal, or for
the analysis of near-surface regions of a
specimen, a separate detector is available
for recoding the scattering of
grazing-incidence X-rays (GIXS,
grazing-incidence X-ray scattering). The
integrated computer system acquires the
data, removes background noise, and
evaluates the spectral peaks. The computer
system also includes a database and
searching software for identifying the
phases or compounds found in samples. A
high-temperature (1600 °C) camera
enables in situ studies.
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