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In addition to the usual imaging and
microanalysis features that are routine for
SEMs, the Philips XL30
environmental scanning electron
microscope (ESEM) has capabilities for
admitting and imaging in various gases,
including water vapor, at pressures up to
20 mbar. Thus, in combination with a
cooling stage available with the
instrument, it is possible to image samples
in a moist condition, as well as at
temperatures and pressures below the dew
point of water. In addition to this
capability, the instrument has a tensile
stage, with capability of heating up to
1000 °C and a dedicated heating
stage, which can go to 1500 °C.
Further, this microscope is equipped with
an EBSP (electron backscatter pattern)
detector, capable of producing patterns
suitable for crystallographic analysis.
Finally, the system is capable of OIM
(orientation imaging microscopy), an
automatic method of mapping crystallite
orientations at the surface of a
crystalline material.
This material is based upon
work supported by the National Science
Foundation under Grant No. CTS-9870984. Any
opinions, findings, and conclusions or
recommendations expressed in this material
are those of the author(s) and do not
necessarily reflect the views of the
National Science Foundation.
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