MATERIALS SCIENCE AND ENGINEERING

RESEARCH PROJECTS

• Alloy Surface Hardening by Colossal Supersaturation of Interstitial Solutes.
• Carbide Formation in Austenitic Stainless Steels with a Colossal Supersaturation of Carbon.
• Microstructural Characterization of Carburized Stainless Steels 13-8Mo and AL6XN
• Corrosion of Low-Temperature-Carburized Austenitic Stainless Steels
• Corrosion Behavior of Duplex and Martensitic Structural Alloys Carburized under Para-Equilibrium Conditions
• Microcharacterization of Low-Temperature-Carburized Austenitic Stainless Steels
• Low-Temperature Carburization of Ni-Base Alloys
• Surface Nitridation of Ti-Base Alloys
• Surface Carburization of Ti-Base Alloys

Materials for Fuel Cells

• Atomistic Structure of Precious-Metal Catalyst Nanoparticles for PEM Fuel Cells
• Quantitative Assessment of Fuel Cell Catalyst Nanoparticle Size Distributions
• Microcharacterization of Solid-Oxide Fuel Cells

Metal–Oxide Interfaces

• Controlling Metal–Oxide Adhesion by Applied Electric Fields.

Electroplated Metallization Layers

• Microstructure, Growth Mechanism, Defect Formation, and Lateral Structuring of Plated Cu Metallization.

Materials for Photovoltaics

• Liquid-Phase Deposition of Copper Indium Diselenide Thin Films.

Materials for Nanotechnology

• Self-Assembled Nanowires on Layered-Crystals.
• Atomistic Structure and Composition of II–VI Quantum-Well Quantum-Dots.
• Silica-Based Nanospheres and Nanowires.
• Fabrication of Nanocapacitors by Anodic Oxidaton of Titanium
• Nanostructured Semiconductor Heteromaterials: Quantum dots, buffer layers for ultrafast SiGe hetero MOSFETs, mechanisms of epitaxial growth.

GENERAL INTERESTS

Microstructure of Crystalline Materials:
Crystal structure, defects, structure–property relationships.

Interfaces in Crystalline Materials:
Grain boundaries, heteroepitaxial interfaces.

Transmission Electron Microscopy:
Conventional TEM, high-resolution TEM, analytical TEM, energy-filtering TEM.

FACILITIES

Swagelok Center for Surface Analysis of Materials (SCSAM)

Transmission Electron Microscope Tecnai F30

Transmission Electron Microscope Philips CM20

Scanning Electron Microscope Hitachi S4500

Scanning Electron Microscope Philips XL30

Dual Beam Focused Ion Beam System FEI xT Nova Nanolab 200

Scanning Auger Microprobe System Perkin-Elmer PHI-680

X-ray Photo-Electron Spectrometry System Perkin-Elmer PHI-5600

X-ray Diffractometer Scintag X-1

Atomic Force Microscope DI Dimension 3100 with Hysitron Triboscope

Ion Accelerator NEC 5HSD